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Strain Effect in Semiconductors: Theory and Device...

Strain Effect in Semiconductors: Theory and Device Applications

Yongke Sun, Scott E. Thompson, Toshikazu Nishida (auth.)
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Strain Effect in Semiconductors: Theory and Device Applications presents the fundamentals and applications of strain in semiconductors and semiconductor devices that is relevant for strain-enhanced advanced CMOS technology and strain-based piezoresistive MEMS transducers. The book discusses relevant applications of strain while also focusing on the fundamental physics as they pertain to bulk, planar, and scaled nano-devices. Lead authors Yongke Sun, Scott Thompson and Toshikazu Nishida also:

  • Treat strain physics at both the qualitative overview level as well as provide detailed fundamentals
  • Explain strain physics relevant to logic devices as well as strain-based MEMS

This book is relevant to current strained Si logic technology, as well as for understanding the physics and scaling of future strain nano-scale devices. It is perfect for practicing device engineers at semiconductor manufacturers, as well as graduate students studying device physics at universities.

類別:
年:
2010
版本:
1
出版商:
Springer US
語言:
english
頁數:
350
ISBN 10:
1441905510
ISBN 13:
9781441905512
文件:
PDF, 8.23 MB
IPFS:
CID , CID Blake2b
english, 2010
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